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100%: Head, A.K.: Computed Electron Micrographs and Defect Identification (Defects in Crystalline Solids) (Volume 7) (ISBN: 9780720417579) 1973, Elsevier Science Publishing Co Inc.,U.S., in Englisch, Band: 7, Broschiert.Nur diese Ausgabe anzeigen…
82%: A.K. Head: Computed Electron Micrographs And Defect Identification (ISBN: 9780444601476) North-Holland, in Englisch, auch als eBook.Nur diese Ausgabe anzeigen…
79%: A. K. Head: Computed Electron Micrographs and Defect Indentification (ISBN: 9780444104625) Elsevier Science, in Englisch, Broschiert.Nur diese Ausgabe anzeigen…
Computed Electron Micrographs and Defect Identification (Defects in Crystalline Solids) (Volume 7)
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Computed Electron Micrographs and Defect Identification (Defects in Crystalline Solids) (Volume 7) (1973)
EN HCISBN: 9780720417579 bzw. 0720417570, Band: 7, in Englisch, Elsevier Science Publishing Co Inc.,U.S. gebundenes Buch.
Lieferung aus: Vereinigtes Königreich Großbritannien und Nordirland, Versandkosten nach: USA.
Von Händler/Antiquariat, Anybook Ltd.
Elsevier Science Publishing Co Inc.,U.S., 1973. Volume 7. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In fair condition, suitable as a study copy.
Von Händler/Antiquariat, Anybook Ltd.
Elsevier Science Publishing Co Inc.,U.S., 1973. Volume 7. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In fair condition, suitable as a study copy.
2
Symbolbild
Computed Electron Micrographs and Defect Identification (Defects in Crystalline Solids) (Volume 7) (1973)
EN HC USISBN: 9780720417579 bzw. 0720417570, Band: 7, in Englisch, Elsevier Science Publishing Co Inc.,U.S. gebundenes Buch, gebraucht.
Von Händler/Antiquariat, Anybook Ltd. [312675], Lincoln, United Kingdom.
Volume 7. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In fair condition, suitable as a study copy.
Volume 7. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In fair condition, suitable as a study copy.
3
Computed Electron Micrographs And Defect Identification
EN NW EBISBN: 9780720417579 bzw. 0720417570, in Englisch, Elsevier Science, neu, E-Book.
Lieferung aus: Vereinigte Staaten von Amerika, E-Book zum download.
Technology, Computed Electron Micrographs and Defect Identification illustrates a technique for identifying defects in crystalline solids by the comparison of their images, which are produced in the electron microscope, with corresponding theoretical images. This book discusses the diffraction of electrons by a crystal; the two-beam dynamical equations; the absorption parameters; the deviation of the crystal from the Bragg reflecting position; the extinction distance; the displacement vector; and the foil normal. Chapter three presents the experimental techniques for determination of beam direction, defect line normal, foil normal, foil thickness, and extinction distance. Chapters four to seven explore ONEDIS and TWODIS and their principles. Chapters eight and nine focus on the application and limitations of the technique, while the last chapter explores the different computer programs related to the technique. Post-graduate students, as well as researchers using transmission electron microscopy for studying defects in crystalline solids, will find this book invaluable. eBook.
Technology, Computed Electron Micrographs and Defect Identification illustrates a technique for identifying defects in crystalline solids by the comparison of their images, which are produced in the electron microscope, with corresponding theoretical images. This book discusses the diffraction of electrons by a crystal; the two-beam dynamical equations; the absorption parameters; the deviation of the crystal from the Bragg reflecting position; the extinction distance; the displacement vector; and the foil normal. Chapter three presents the experimental techniques for determination of beam direction, defect line normal, foil normal, foil thickness, and extinction distance. Chapters four to seven explore ONEDIS and TWODIS and their principles. Chapters eight and nine focus on the application and limitations of the technique, while the last chapter explores the different computer programs related to the technique. Post-graduate students, as well as researchers using transmission electron microscopy for studying defects in crystalline solids, will find this book invaluable. eBook.
4
Computed Electron Micrographs and Defect Indentification
EN HC NWISBN: 9780444104625 bzw. 0444104623, in Englisch, Elsevier Science, gebundenes Buch, neu.
Lieferung aus: Vereinigte Staaten von Amerika, Lagernd.
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Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
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