High-Resolution X-Ray Scattering from Thin Films and Multilayers
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Bester Preis: € 3,43 (vom 07.08.2019)1
High-Resolution X-Ray Scattering from Thin Films and Multilayers
~EN NW EB DLISBN: 9783540496250 bzw. 3540496254, vermutlich in Englisch, Springer Shop, neu, E-Book, elektronischer Download.
Lieferung aus: Vereinigtes Königreich Großbritannien und Nordirland, Lagernd, zzgl. Versandkosten.
This critical overview presents experimental methods for solving most frequent strucutral problems of mono-crystalline thin films and layered systems: thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dynamical scattering theories describes the experimental methods. This book is a ready-to-hand reference for experimentalists who want to improve their knowledge on modern x-ray methods for thin-film analysis. eBook.
This critical overview presents experimental methods for solving most frequent strucutral problems of mono-crystalline thin films and layered systems: thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dynamical scattering theories describes the experimental methods. This book is a ready-to-hand reference for experimentalists who want to improve their knowledge on modern x-ray methods for thin-film analysis. eBook.
2
High-Resolution X-Ray Scattering from Thin Films and Multilayers
DE NW EBISBN: 9783540496250 bzw. 3540496254, in Deutsch, Springer Nature, neu, E-Book.
Lieferung aus: Deutschland, Lagernd, zzgl. Versandkosten.
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Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
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