High-Resolution X-Ray Scattering from Thin Films and Multilayers (Springer Tracts in Modern Physics (eBook)
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High-Resolution X-Ray Scattering from Thin Films and Multilayers: High Resolution X-Ray Scattering from Crystalline Thin Films (Springer Tracts in Modern Physics) (1998)
DE HCISBN: 9783540620297 bzw. 354062029X, in Deutsch, Springer, gebundenes Buch.
Lieferung aus: Vereinigtes Königreich Großbritannien und Nordirland, Versandkosten nach: DEU.
Von Händler/Antiquariat, Anybook Ltd.
Springer, 1998. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. , 650grams, ISBN:9783540620297.
Von Händler/Antiquariat, Anybook Ltd.
Springer, 1998. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. , 650grams, ISBN:9783540620297.
2
Symbolbild
High-Resolution X-Ray Scattering from Thin Films and Multilayers: High Resolution X-Ray Scattering from Crystalline Thin Films (Springer Tracts in Modern Physics) (1998)
DE HC USISBN: 9783540620297 bzw. 354062029X, in Deutsch, Springer, gebundenes Buch, gebraucht.
Von Händler/Antiquariat, Anybook Ltd. [312675], Lincoln, United Kingdom.
This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition.
This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition.
3
High-Resolution X-Ray Scattering from Thin Films and Multilayers (Springer Tracts in Modern Physics) (1998)
EN HC USISBN: 9783540620297 bzw. 354062029X, in Englisch, 258 Seiten, Springer, gebundenes Buch, gebraucht.
Lieferung aus: Vereinigte Staaten von Amerika, Usually ships in 1-2 business days, tatsächliche Versandkosten können abweichen.
Von Händler/Antiquariat, alejduarte.
This critical overview presents experimental methods for solving most frequent strucutral problems of mono-crystalline thin films and layered systems: thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dynamical scattering theories describes the experimental methods. This book is a ready-to-hand reference for experimentalists who want to improve their knowledge on modern x-ray methods for thin-film analysis. Hardcover, Label: Springer, Springer, Produktgruppe: Book, Publiziert: 1998-12-22, Studio: Springer, Verkaufsrang: 6155654.
Von Händler/Antiquariat, alejduarte.
This critical overview presents experimental methods for solving most frequent strucutral problems of mono-crystalline thin films and layered systems: thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dynamical scattering theories describes the experimental methods. This book is a ready-to-hand reference for experimentalists who want to improve their knowledge on modern x-ray methods for thin-film analysis. Hardcover, Label: Springer, Springer, Produktgruppe: Book, Publiziert: 1998-12-22, Studio: Springer, Verkaufsrang: 6155654.
4
High-Resolution X-Ray Scattering from Thin Films and Multilayers: High Resolution X-Ray Scattering from Crystalline Thin Films (Springer Tracts in Modern Physics) (1998)
EN HC USISBN: 9783540620297 bzw. 354062029X, in Englisch, 258 Seiten, Springer, gebundenes Buch, gebraucht.
New from: £72.00 (2 Offers)
Used from: £41.21 (2 Offers)
Lieferung aus: Vereinigtes Königreich Großbritannien und Nordirland, In stock. real shipping costs can differ.
Von Händler/Antiquariat, anybookltd.
Springer, Hardcover, Published: 1998-12-11T00:00:01Z, Product group: Book.
Von Händler/Antiquariat, anybookltd.
Springer, Hardcover, Published: 1998-12-11T00:00:01Z, Product group: Book.
5
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High-Resolution X-Ray Scattering from Thin Films and Multilayers (Springer Tracts in Modern Physics (eBook) (1999)
DE HCISBN: 9783540620297 bzw. 354062029X, in Deutsch, Springer-Verlag Telos, gebundenes Buch.
Lieferung aus: Vereinigte Staaten von Amerika, Versandkosten nach: DEU.
Von Händler/Antiquariat, Ergodebooks.
Springer-Verlag Telos, 1999-04-01. Hardcover. Good.
Von Händler/Antiquariat, Ergodebooks.
Springer-Verlag Telos, 1999-04-01. Hardcover. Good.
7
Symbolbild
High-Resolution X-Ray Scattering from Thin Films and Multilayers (Springer Tracts in Modern Physics (eBook) (1999)
~EN HCISBN: 9783540620297 bzw. 354062029X, vermutlich in Englisch, Springer-Verlag Telos, gebundenes Buch.
Von Händler/Antiquariat, Ergodebooks [8304062], RICHMOND, TX, U.S.A.
Books.
Books.
8
High-Resolution X-Ray Scattering from Thin Films and Multilayers (1998)
EN HC US FEISBN: 9783540620297 bzw. 354062029X, in Englisch, 258 Seiten, Springer, gebundenes Buch, gebraucht, Erstausgabe.
Lieferung aus: Kanada, Usually ships within 6 - 10 business days, tatsächliche Versandkosten können abweichen.
Von Händler/Antiquariat, Ergodebooks Ships from USA.
Hardcover, Ausgabe: 1, Label: Springer, Springer, Produktgruppe: Book, Publiziert: 1998-12-22, Studio: Springer.
Von Händler/Antiquariat, Ergodebooks Ships from USA.
Hardcover, Ausgabe: 1, Label: Springer, Springer, Produktgruppe: Book, Publiziert: 1998-12-22, Studio: Springer.
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