Characterization Problems Associated with the Exponential Distribution.
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Problems of calculating the reliability of instruments and systems and the development of measures to increase efficiency and reduce operational costs confronted physicists and mathe­ maticians at the end of the '40's and the beginning of the '50's in connection with the unrelia­ bility of electro-vacuum instruments used in aviation. Since then steadily increasing demands for the accuracy, reliability and complexity required in electronic equipment have served as a stimulus in the development of the theory of reliability. From 1950 to 1955 Epstein and Sobel [67,68] and Davis [62], in an analysis of statistical data of the operating time of an instrument up to failure, showed that the distribution is exponential in many cases. Consequently, the ex­ ponential distribution became basic to research associated with experiments on life expectancy. Further research has shown that there are a whole series of problems in reliability theory for which the exponential distribution is inapplicable. However, it can practically always be used as a first approximation. The ease of computational work due to the nice properties of the exponential distribution (for example, the lack of memory property, see Section 1) is also a reason for its frequent use. AB a rule, data on the behavior of the failure rate function are used to test the hypothesis that a given distribution belongs to the class of exponential distributions, and order statistics are used to estimate the parameter of the exponential distribution. Paperback, Ausgabe: Softcover reprint of the original 1st ed. 1986, Label: Springer, Springer, Produktgruppe: Book, Publiziert: 2011-10-01, Freigegeben: 2011-10-01, Studio: Springer.

Von Händler/Antiquariat, Kloof Booksellers & Scientia Verlag [18355], Amsterdam, Netherlands.
Berlin & New York: Springer-Verlag, 1986. Hardbound. 137 pp. Index. Condition : fine. Condition : very good copy. ISBN 9783540963165. Keywords : , Books.

Von Händler/Antiquariat, Kloof Booksellers & Scientia Verlag [18355], Amsterdam, Netherlands.
Berlin & New York: Springer-Verlag, 1986. Hardbound. 137 pp. Index. Condition : fine. Condition : very good. ISBN 3540963162. KEYWORDS: MATHEMATICS,.

Von Händler/Antiquariat, Kloof Booksellers & Scientia Verlag [18355], Amsterdam, Netherlands.
Berlin & New York: Springer-Verlag, 1986. Hardbound. 137 pp. Index. Condition : fine. Condition : very good. ISBN 3540963162[KEYWORDS: MATHEMATICS,.

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137 pp., Hardcover, ex library, else text clean and binding tight. Hard cover.

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Problems of calculating the reliability of instruments and systems and the development of measures to increase efficiency and reduce operational costs confronted physicists and mathe- maticians at the end of the '40's and the beginning of the '50's in connection with the unrelia- bility of electro-vacuum instruments used in aviation. Since then steadily increasing demands for the accuracy, reliability and complexity required in electronic equipment have served as a stimulus in the development of... Problems of calculating the reliability of instruments and systems and the development of measures to increase efficiency and reduce operational costs confronted physicists and mathe- maticians at the end of the '40's and the beginning of the '50's in connection with the unrelia- bility of electro-vacuum instruments used in aviation. Since then steadily increasing demands for the accuracy, reliability and complexity required in electronic equipment have served as a stimulus in the development of the theory of reliability. From 1950 to 1955 Epstein and Sobel [67,68] and Davis [62], in an analysis of statistical data of the operating time of an instrument up to failure, showed that the distribution is exponential in many cases. Consequently, the ex- ponential distribution became basic to research associated with experiments on life expectancy. Further research has shown that there are a whole series of problems in reliability theory for which the exponential distribution is inapplicable. However, it can practically always be used as a first approximation. The ease of computational work due to the nice properties of the exponential distribution (for example, the lack of memory property, see Section 1) is also a reason for its frequent use. AB a rule, data on the behavior of the failure rate function are used to test the hypothesis that a given distribution belongs to the class of exponential distributions, and order statistics are used to estimate the parameter of the exponential distribution. Productinformatie:Taal: Engels;Afmetingen: 8x234x156 mm;Gewicht: 235,00 gram;ISBN10: 146129374X;ISBN13: 9781461293743; Engels | Paperback | 2011.

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Problems of calculating the reliability of instruments and systems and the development of measures to increase efficiency and reduce operational costs confronted physicists and mathe­ maticians at the end of the '40's and the beginning of the '50's in connection with the unrelia­ bility of electro-vacuum instruments used in aviation. Since then steadily increasing demands for the accuracy, reliability and complexity required in electronic equipment have served as a stimulus in the development of... Problems of calculating the reliability of instruments and systems and the development of measures to increase efficiency and reduce operational costs confronted physicists and mathe­ maticians at the end of the '40's and the beginning of the '50's in connection with the unrelia­ bility of electro-vacuum instruments used in aviation. Since then steadily increasing demands for the accuracy, reliability and complexity required in electronic equipment have served as a stimulus in the development of the theory of reliability. From 1950 to 1955 Epstein and Sobel [67,68] and Davis [62], in an analysis of statistical data of the operating time of an instrument up to failure, showed that the distribution is exponential in many cases. Consequently, the ex­ ponential distribution became basic to research associated with experiments on life expectancy. Further research has shown that there are a whole series of problems in reliability theory for which the exponential distribution is inapplicable. However, it can practically always be used as a first approximation. The ease of computational work due to the nice properties of the exponential distribution (for example, the lack of memory property, see Section 1) is also a reason for its frequent use. AB a rule, data on the behavior of the failure rate function are used to test the hypothesis that a given distribution belongs to the class of exponential distributions, and order statistics are used to estimate the parameter of the exponential distribution.Taal: Engels;Verschijningsdatum: september 1986;ISBN10: 0387963162;ISBN13: 9780387963167; Engelstalig | Hardcover | 1986.

Von Händler/Antiquariat, Kloof Booksellers & Scientia Verlag [18355], Amsterdam, Netherlands.
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Softcover reprint of the original 1st ed. 1986. Softcover reprint of the original 1st ed. 1986.