Digital Circuit Testing and Testability (The Morgan Kaufmann Series in Computer Architecture and Design)
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1
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Digital Circuit Testing and Testability (The Morgan Kaufmann Series in Computer Architecture and Design)
EN USISBN: 9780124343306 bzw. 0124343309, in Englisch, Academic Press, gebraucht.
Lieferung aus: Vereinigte Staaten von Amerika, Versandkostenfrei nach: USA.
Von Händler/Antiquariat, Better World Books.
Academic Press. Used - Good. Former Library book. Shows some signs of wear, and may have some markings on the inside. 100% Money Back Guarantee. Shipped to over one million happy customers. Your purchase benefits world literacy!
Von Händler/Antiquariat, Better World Books.
Academic Press. Used - Good. Former Library book. Shows some signs of wear, and may have some markings on the inside. 100% Money Back Guarantee. Shipped to over one million happy customers. Your purchase benefits world literacy!
2
Digital Circuit Testing and Testability
ENISBN: 9780124343306 bzw. 0124343309, in Englisch, Academic Press.
Lieferung aus: Vereinigte Staaten von Amerika, Lagernd.
Digital Circuit Testing and Testability Lala, Parag K. / Lala, In the past few years, reliable hardware system design has become increasingly important in the computer industry. Digital Circuit Testing and Testability is an easy to use introduction to the practices and techniques in this field. Parag K. Lala writes in a user-friendly and tutorial style, making the book easy to read, even for the newcomer to fault-tolerant system design. Each informative chapter is self-contained, with little or no previous knowledge of a topic assumed. Extensive references follow each chapter, making further research in a particular area readily available. Each chapter covers a different aspect or technological component of fault-tolerant system design, and this book is an excellent compilation of up-to-date information in an area where such a book is needed. Key Features * Contains the most up-to-date information on fault modeling in CMOS devices * Provides comprehensive coverage of self-checking logic design at the gate and the transistor level * Discusses the latest techniques available for testing state machines * Presents a collection of methods for testable logic synthesis * Provides state-of-the-art information on Built-in-self-testing * Includes detailed coverage of memory testing * Discusses all major techniques for fault-tolerant hardware design.
Digital Circuit Testing and Testability Lala, Parag K. / Lala, In the past few years, reliable hardware system design has become increasingly important in the computer industry. Digital Circuit Testing and Testability is an easy to use introduction to the practices and techniques in this field. Parag K. Lala writes in a user-friendly and tutorial style, making the book easy to read, even for the newcomer to fault-tolerant system design. Each informative chapter is self-contained, with little or no previous knowledge of a topic assumed. Extensive references follow each chapter, making further research in a particular area readily available. Each chapter covers a different aspect or technological component of fault-tolerant system design, and this book is an excellent compilation of up-to-date information in an area where such a book is needed. Key Features * Contains the most up-to-date information on fault modeling in CMOS devices * Provides comprehensive coverage of self-checking logic design at the gate and the transistor level * Discusses the latest techniques available for testing state machines * Presents a collection of methods for testable logic synthesis * Provides state-of-the-art information on Built-in-self-testing * Includes detailed coverage of memory testing * Discusses all major techniques for fault-tolerant hardware design.
3
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Digital Circuit Testing and Testability (The Morgan Kaufmann Series in Computer Architecture and Design) (1997)
~EN HC US FEISBN: 9780124343306 bzw. 0124343309, vermutlich in Englisch, Academic Press, San Diego, gebundenes Buch, gebraucht, akzeptabler Zustand, Erstausgabe.
Von Händler/Antiquariat, Bob's Book Journey [606053], Austin, TX, U.S.A.
Hardcover, xii, 199 pp. Moderate wear at corners and ends of spine, unmarked, tight binding. Books.
Hardcover, xii, 199 pp. Moderate wear at corners and ends of spine, unmarked, tight binding. Books.
4
Digital Circuit Testing and Testability
EN USISBN: 0124343309 bzw. 9780124343306, in Englisch, Academic Press, gebraucht.
Lieferung aus: Vereinigte Staaten von Amerika, Lagernd.
computer science,computers and technology,design and architecture,electrical and electronic engineering,electrical and electronics,engineering,logic,programming,software design testing and engineering,textbooks, Digital Circuit Testing and Testability (The Morgan Kaufmann Series in Computer Architecture and Design), In the past few years, reliable hardware system design has become increasingly important in the computer industry. Digital Circuit Testing and Testability is an easy to use introduction to the practices and techniques in this field. Parag K. Lala writes in a user-friendly and tutorial style, making the book easy to read, even for the newcomer to fault-tolerant system design. Each informative chapter is self-contained, with little or no previous knowledge of a topic assumed. Extensive references follow each chapter, making further research in a particular area readily available. Each chapter covers a different aspect or technological component of fault-tolerant system design, and this book is an excellent compilation of up-to-date information in an area where such a book is needed. Key Features* Contains the most up-to-date information on fault modeling in CMOS devices* Provides comprehensive coverage of self-checking logic design at the gate and the transistor level* Discusses the latest techniques available for testing state machines* Presents a collection of methods for testable logic synthesis* Provides state-of-the-art information on Built-in-self-testing* Includes detailed coverage of memory testing* Discusses all major techniques for fault-tolerant hardware design.
computer science,computers and technology,design and architecture,electrical and electronic engineering,electrical and electronics,engineering,logic,programming,software design testing and engineering,textbooks, Digital Circuit Testing and Testability (The Morgan Kaufmann Series in Computer Architecture and Design), In the past few years, reliable hardware system design has become increasingly important in the computer industry. Digital Circuit Testing and Testability is an easy to use introduction to the practices and techniques in this field. Parag K. Lala writes in a user-friendly and tutorial style, making the book easy to read, even for the newcomer to fault-tolerant system design. Each informative chapter is self-contained, with little or no previous knowledge of a topic assumed. Extensive references follow each chapter, making further research in a particular area readily available. Each chapter covers a different aspect or technological component of fault-tolerant system design, and this book is an excellent compilation of up-to-date information in an area where such a book is needed. Key Features* Contains the most up-to-date information on fault modeling in CMOS devices* Provides comprehensive coverage of self-checking logic design at the gate and the transistor level* Discusses the latest techniques available for testing state machines* Presents a collection of methods for testable logic synthesis* Provides state-of-the-art information on Built-in-self-testing* Includes detailed coverage of memory testing* Discusses all major techniques for fault-tolerant hardware design.
5
Symbolbild
Digital Circuit Testing and Testability (The Morgan Kaufmann Series in Computer Architecture and Design) (1997)
~EN HC USISBN: 9780124343306 bzw. 0124343309, vermutlich in Englisch, Academic Press, gebundenes Buch, gebraucht, guter Zustand.
Lieferung aus: Vereinigte Staaten von Amerika, Versandkosten nach: DEU.
Von Händler/Antiquariat, Ergodebooks.
Academic Press, 1997-01-28. Hardcover. Used: Good.
Von Händler/Antiquariat, Ergodebooks.
Academic Press, 1997-01-28. Hardcover. Used: Good.
6
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The Morgan Kaufmann Series in Computer Architecture and Design: Digital Circuit Testing and Testability
EN USISBN: 9780124343306 bzw. 0124343309, in Englisch, Academic Press, Vereinigte Staaten von Amerika, gebraucht.
Von Händler/Antiquariat, Castle Rock [54302400], Pittsford, NY, U.S.A.
Book Condition: Good.
Book Condition: Good.
7
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Digital Circuit Testing and Testability (The Morgan Kaufmann Series in Computer Architecture and Design) (1997)
~EN HC NWISBN: 9780124343306 bzw. 0124343309, vermutlich in Englisch, Academic Press, gebundenes Buch, neu.
Von Händler/Antiquariat, GoldenWavesOfBooks [72982182], Fayetteville, TX, U.S.A.
Books.
Books.
8
Symbolbild
Digital Circuit Testing and Testability (The Morgan Kaufmann Series in Computer Architecture and Design) (1997)
~EN HC NWISBN: 9780124343306 bzw. 0124343309, vermutlich in Englisch, Academic Press, gebundenes Buch, neu.
Von Händler/Antiquariat, GoldBooks [71454205], Austin, TX, U.S.A.
Books.
Books.
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