Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits: The System on Chip Approach
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Bester Preis: € 98,75 (vom 22.04.2017)1
Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits
EN NWISBN: 9780863417450 bzw. 0863417450, in Englisch, Institution of Engineering and Technology, neu.
Lieferung aus: Vereinigtes Königreich Großbritannien und Nordirland, in-stock.
This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits and systems in a single source. The book contains eleven chapters written by leading researchers world-wide. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of these areas. A complete range of circuit components are covered and test issues are also addressed from the SoC perspective. A must-have reference companion to researchers and engineers in mixed-signal testing, the book can also be used as a text for postgraduate and senior undergraduate students.
This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits and systems in a single source. The book contains eleven chapters written by leading researchers world-wide. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of these areas. A complete range of circuit components are covered and test issues are also addressed from the SoC perspective. A must-have reference companion to researchers and engineers in mixed-signal testing, the book can also be used as a text for postgraduate and senior undergraduate students.
2
Test and Diagnosis of Analogue, Mixed-signal and RF Integrated Circuits
EN NW EBISBN: 9780863417450 bzw. 0863417450, in Englisch, The Institution of Engineering and Technology, neu, E-Book.
Lieferung aus: Vereinigte Staaten von Amerika, Ebook for download.
Technology, This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. The book reports systematically the state of the arts and future research directions of those areas. eBook.
Technology, This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. The book reports systematically the state of the arts and future research directions of those areas. eBook.
3
Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits: The System on Chip Approach
EN PB NWISBN: 9780863417450 bzw. 0863417450, in Englisch, The Institution of Engineering and Technology, Taschenbuch, neu.
Lieferung aus: Vereinigte Staaten von Amerika, In Stock.
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
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