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100%: Tanner, B.K.: X-Ray Diffraction Topography: International Series in the Science of the Solid State (ISBN: 9781483187686) 2013, Pergamon, Pergamon, Pergamon, in Englisch, auch als eBook.Nur diese Ausgabe anzeigen…
30%: Tanner, Brian K.: X-Ray Diffraction Topography (International series in the science of the solid state ; v. 10) (ISBN: 9780080196923) 1976, Erstausgabe, in Englisch, Broschiert.Nur diese Ausgabe anzeigen…
X-Ray Diffraction Topography: International Series in the Science of the Solid State
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Bester Preis: € 23,80 (vom 27.07.2016)1
X-Ray Diffraction Topography
EN NW EBISBN: 9780080196923 bzw. 0080196926, in Englisch, Elsevier Science, neu, E-Book.
Lieferung aus: Vereinigte Staaten von Amerika, E-Book zum download.
Science, X-Ray Diffraction Topography presents an elementary treatment of X-ray topography which is comprehensible to the non-specialist. It discusses the development of the principles and application of the subject matter. X-ray topography is the study of crystals which use x-ray diffraction. Some of the topics covered in the book are the basic dynamical x-ray diffraction theory, the Berg-Barrett method, Lang's method, double crystal methods, the contrast on x-ray topography, and the analysis of crystal defects and distortions. The crystals grown from solution are covered. The naturally occurring crystals are discussed. The text defines the meaning of melt, solid state and vapour growth. An analysis of the properties of inorganic crystals is presented. A chapter of the volume is devoted to the characteristics of metals. Another section of the book focuses on the production of ice crystals and the utilization of oxides as laser materials. The book will provide useful information to chemists, scientists, students and researchers. eBook.
Science, X-Ray Diffraction Topography presents an elementary treatment of X-ray topography which is comprehensible to the non-specialist. It discusses the development of the principles and application of the subject matter. X-ray topography is the study of crystals which use x-ray diffraction. Some of the topics covered in the book are the basic dynamical x-ray diffraction theory, the Berg-Barrett method, Lang's method, double crystal methods, the contrast on x-ray topography, and the analysis of crystal defects and distortions. The crystals grown from solution are covered. The naturally occurring crystals are discussed. The text defines the meaning of melt, solid state and vapour growth. An analysis of the properties of inorganic crystals is presented. A chapter of the volume is devoted to the characteristics of metals. Another section of the book focuses on the production of ice crystals and the utilization of oxides as laser materials. The book will provide useful information to chemists, scientists, students and researchers. eBook.
2
X-Ray Diffraction Topography: International Series in the Science of the Solid State (2013)
EN NW EB DLISBN: 9781483187686 bzw. 1483187683, in Englisch, Pergamon, Pergamon, Pergamon, neu, E-Book, elektronischer Download.
Lieferung aus: Kanada, in-stock.
X-Ray Diffraction Topography presents an elementary treatment of X-ray topography which is comprehensible to the non-specialist. It discusses the development of the principles and application of the subject matter. X-ray topography is the study of crystals which use x-ray diffraction. Some of the topics covered in the book are the basic dynamical x-ray diffraction theory, the Berg-Barrett method, Lang's method, double crystal methods, the contrast on x-ray topography, and the analysis of crystal defects and distortions. The crystals grown from solution are covered. The naturally occurring crystals are discussed. The text defines the meaning of melt, solid state and vapour growth. An analysis of the properties of inorganic crystals is presented. A chapter of the volume is devoted to the characteristics of metals. Another section of the book focuses on the production of ice crystals and the utilization of oxides as laser materials. The book will provide useful information to chemists, scientists, students and researchers.
X-Ray Diffraction Topography presents an elementary treatment of X-ray topography which is comprehensible to the non-specialist. It discusses the development of the principles and application of the subject matter. X-ray topography is the study of crystals which use x-ray diffraction. Some of the topics covered in the book are the basic dynamical x-ray diffraction theory, the Berg-Barrett method, Lang's method, double crystal methods, the contrast on x-ray topography, and the analysis of crystal defects and distortions. The crystals grown from solution are covered. The naturally occurring crystals are discussed. The text defines the meaning of melt, solid state and vapour growth. An analysis of the properties of inorganic crystals is presented. A chapter of the volume is devoted to the characteristics of metals. Another section of the book focuses on the production of ice crystals and the utilization of oxides as laser materials. The book will provide useful information to chemists, scientists, students and researchers.
3
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X-Ray Diffraction Topography (International series in the science of the solid state ; v. 10) (1976)
EN US FEISBN: 9780080196923 bzw. 0080196926, in Englisch, Pergamon Pr, gebraucht, Erstausgabe.
Lieferung aus: Vereinigte Staaten von Amerika, Versandkostenfrei.
Von Händler/Antiquariat, Better World Books [51315977], Mishawaka, IN, U.S.A.
Former Library book. Shows some signs of wear, and may have some markings on the inside.
Von Händler/Antiquariat, Better World Books [51315977], Mishawaka, IN, U.S.A.
Former Library book. Shows some signs of wear, and may have some markings on the inside.
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X-ray Diffraction Topography (International series in the science of the solid state) (1976)
EN HC USISBN: 9780080196923 bzw. 0080196926, in Englisch, Pergamon Press, gebundenes Buch, gebraucht.
Von Händler/Antiquariat, Anybook Ltd. [312675], Lincoln, United Kingdom.
This book has hardback covers. Ex-library, With usual stamps and markings, In fair condition, suitable as a study copy.
This book has hardback covers. Ex-library, With usual stamps and markings, In fair condition, suitable as a study copy.
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X-Ray Diffraction Topography. (1976)
EN HCISBN: 9780080196923 bzw. 0080196926, in Englisch, Pergamon, Oxford, gebundenes Buch.
Von Händler/Antiquariat, Antiquariat Silvanus [1047595], Ahrbrück, Germany.
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
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X-Ray Diffraction Topography (International Series in the Science of the Solid State; V. 10) (1976)
EN HC USISBN: 9780080196923 bzw. 0080196926, in Englisch, Pergamon Pr, gebundenes Buch, gebraucht.
Lieferung aus: Vereinigte Staaten von Amerika, zzgl. Versandkosten, Verandgebiet: DOM.
Von Händler/Antiquariat, booklab, VA, Chantilly, [RE:4].
Great customer service. You will be happy! Hardcover.
Von Händler/Antiquariat, booklab, VA, Chantilly, [RE:4].
Great customer service. You will be happy! Hardcover.
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