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Advanced Transmission Electron Microscopy, Applications to Nanomaterials100%: Springer International Publishing AG: Advanced Transmission Electron Microscopy, Applications to Nanomaterials (ISBN: 9783319382890) 2016, in Englisch, Taschenbuch.
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Advanced Transmission Electron Microscopy100%: Francis Leonard Deepak, Alvaro Mayoral, Raul Arenal: Advanced Transmission Electron Microscopy (ISBN: 9783319151779) 2015, in Englisch, Taschenbuch.
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Advanced Transmission Electron Microscopy: Applications for Nanomaterials79%: Deepak, Francis Leonard (Edited by)/ Mayoral, Alvaro (Edited by)/ Arenal, Raul (Edited by): Advanced Transmission Electron Microscopy: Applications for Nanomaterials (ISBN: 9783319151762) 2015, in Deutsch, Broschiert.
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Advanced Transmission Electron Microscopy, Applications to Nanomaterials
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Bester Preis: 6,99 (vom 30.11.2019)
1
9783319151779 - Francis Leonard Deepak, Alvaro Mayoral, Raul Arenal: Advanced Transmission Electron Microscopy - Applications to Nanomaterials
Francis Leonard Deepak, Alvaro Mayoral, Raul Arenal

Advanced Transmission Electron Microscopy - Applications to Nanomaterials

Lieferung erfolgt aus/von: Deutschland DE NW EB DL

ISBN: 9783319151779 bzw. 3319151770, in Deutsch, Springer-Verlag, neu, E-Book, elektronischer Download.

Lieferung aus: Deutschland, E-Book zum Download.
This book highlights the current understanding of materials in the context of new and continuously emerging techniques in the field of electron microscopy. The authors present applications of electron microscopic techniques in characterizing various well-known & new nanomaterials. The applications described include both inorganic nanomaterials as well as organic nanomaterials. Dr. Francis Leonard Deepak Francis Leonard Deepak received his PhD in 2005 from Jawaharlal Nehru Centre for Advanced Scientific Research, Bangalore, India. Subsequently he was a postdoctoral fellow (2006-2008) at the Weizmann Institute of Science, Israel. He joined the International Iberian Nanotechnology Laboratory (INL) Braga, Portugal in 2009 as a research fellow. Since 2013 he is a Staff Researcher and currently leads the Advanced Electron Microscopy Group at INL. His broad area of research is focused on the use of advanced electron microscopic techniques (Aberration Corrected TEM/STEM, Analytical Electron Microscopyand Electron Diffraction) in the investigation of materials/nanomaterials for catalytic as well as other applications. He also employs the Focused Ion Beam (FIB) technique extensivelyinthe investigations of nanodevices. Dr. Alvaro Mayoral Alvaro Mayoral obtained his degree in Chemistry by the University of Alcala (Spain) in 2003, he was awarded with the PhD title by the University of Birmingham in 2009 studying the production of metal nanowires from different porous structures such as zeolites and ordered mesoporous structures. Afterwards, he moved to the University of Texas at San Antonio where he worked with Prof. Miguel Yacaman on the synthesis and characterization of noble metal nanoparticles for applications in catalysis and cancer treatment. Since June 2010, Dr. Mayoral belongs to the Advanced Microscopy Laboratory within the Nanoscience Institute of Aragon at the University of Zaragoza. His research is now mainly focused on the observation of nanocatalysts under the electron microscope and the application of the most advanced techniques into the observation of beam sensitive materials. Dr. Raul Arenal Dr. Raul Arenal received his Ph.D. in Solid State Physics from Univ. Paris-Sud (Orsay, France, 2005) and in 2013, he obtained his Habilitation (HDR) also at this University. In 2007, he became research scientist (chargé de recherches) at the CNRS (France), working at the LEM, CNRS-ONERA (Chatillon, France). Since 2012, Dr. Arenal is on leave from the CNRS and he is currently ARAID research scientist at the LMA - INA of the Universidad de Zaragoza (Spain). His broad area of research interest lies in electron microscopy focused on materials science and nanoscience: TEM (HR(S)TEM, electron diffraction, EELS), as well as in Raman spectroscopy.These studies are mainly focused on the growth mechanism, structural and physical (electronic, optical, vibrational, mechanical) properties of nanomaterials based on carbon, boron and nitrogen as well as other nano-structures.
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9783319382890 - FRANCIS LEONARD DEEPAK: Advanced Transmission Electron Microscopy. Applications to Nanomaterials
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FRANCIS LEONARD DEEPAK

Advanced Transmission Electron Microscopy. Applications to Nanomaterials (2016)

Lieferung erfolgt aus/von: Vereinigtes Königreich Großbritannien und Nordirland DE PB NW

ISBN: 9783319382890 bzw. 3319382896, in Deutsch, Springer, Taschenbuch, neu.

147,82 + Versand: 8,92 = 156,74
unverbindlich
Von Händler/Antiquariat, Herb Tandree Philosophy Books [17426], Stroud, GLOS, United Kingdom.
9783319382890 This listing is a new book, a title currently in-print which we order directly and immediately from the publisher.
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Deepak, Francis Leonard (Edited by)/ Mayoral, Alvaro (Edited by)/ Arenal, Raul (Edited by)

Advanced Transmission Electron Microscopy: Applications for Nanomaterials (2015)

Lieferung erfolgt aus/von: Deutschland DE HC NW

ISBN: 9783319151762 bzw. 3319151762, in Deutsch, Springer, gebundenes Buch, neu.

169,02 + Versand: 9,82 = 178,84
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Von Händler/Antiquariat, Revaluation Books [2134736], Exeter, United Kingdom.
9.30x6.20 inches. In Stock.
4
9783319151779 - Advanced Transmission Electron Microscopy

Advanced Transmission Electron Microscopy (2015)

Lieferung erfolgt aus/von: Deutschland ~EN PB NW

ISBN: 9783319151779 bzw. 3319151770, vermutlich in Englisch, Springer International Publishing, Taschenbuch, neu.

118,99 + Versand: 7,50 = 126,49
unverbindlich
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
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9783319382890 - Springer International Publishing AG: Advanced Transmission Electron Microscopy, Applications to Nanomaterials
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Springer International Publishing AG

Advanced Transmission Electron Microscopy, Applications to Nanomaterials (2016)

Lieferung erfolgt aus/von: Niederlande DE PB NW

ISBN: 9783319382890 bzw. 3319382896, in Deutsch, Springer International Publishing AG, Taschenbuch, neu.

175,00
unverbindlich
Lieferung aus: Niederlande, Vermoedelijk 4-6 weken.
bol.com.
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
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9783319151779 - Advanced Transmission Electron Microscopy

Advanced Transmission Electron Microscopy (2015)

Lieferung erfolgt aus/von: Deutschland ~EN NW EB DL

ISBN: 9783319151779 bzw. 3319151770, vermutlich in Englisch, neu, E-Book, elektronischer Download.

Advanced Transmission Electron Microscopy ab 118.99 EURO Applications to Nanomaterials. Auflage 2015.
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9783319151779 - Alvaro Mayoral, Francis Leonard Deepak, Raul Arenal: Advanced Transmission Electron Microscopy
Alvaro Mayoral, Francis Leonard Deepak, Raul Arenal

Advanced Transmission Electron Microscopy (2015)

Lieferung erfolgt aus/von: Frankreich ~EN NW EB DL

ISBN: 9783319151779 bzw. 3319151770, vermutlich in Englisch, Springer, Springer, Springer, neu, E-Book, elektronischer Download.

Lieferung aus: Frankreich, in-stock.
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
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Francis Leonard Deepak

Advanced Transmission Electron Microscopy (2015)

Lieferung erfolgt aus/von: Deutschland DE NW

ISBN: 9783319151762 bzw. 3319151762, in Deutsch, Springer-Verlag Gmbh Jun 2015, neu.

Lieferung aus: Deutschland, Versandkostenfrei.
Von Händler/Antiquariat, AHA-BUCH GmbH [51283250], Einbeck, Germany.
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9783319151762 - Francis Leonard Deepak: Advanced Transmission Electron Microscopy
Francis Leonard Deepak

Advanced Transmission Electron Microscopy (2015)

Lieferung erfolgt aus/von: Deutschland DE NW

ISBN: 9783319151762 bzw. 3319151762, in Deutsch, Springer-Verlag GmbH, neu.

Lieferung aus: Deutschland, Versandkostenfrei.
buchZ AG, [3859792].
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
10
9783319151762 - Francis Leonard Deepak: Advanced Transmission Electron Microscopy
Francis Leonard Deepak

Advanced Transmission Electron Microscopy

Lieferung erfolgt aus/von: Deutschland DE NW

ISBN: 9783319151762 bzw. 3319151762, in Deutsch, Springer-Verlag GmbH, neu.

Lieferung aus: Deutschland, Versandkostenfrei.
Carl Hübscher GmbH, [4514147].
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
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