Spectroscopy of Complex Oxide Interfaces - 19 Angebote vergleichen
Bester Preis: € 6,50 (vom 20.10.2019)Spectroscopy of Complex Oxide Interfaces: Photoemission and Related Spectroscopies (2019)
ISBN: 9783030091217 bzw. 303009121X, in Deutsch, Springer, neu, Nachdruck.
New Book. Shipped from US within 10 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
Spectroscopy of Complex Oxide Interfaces: Photoemission and Related Spectroscopies (2019)
ISBN: 9783030091217 bzw. 303009121X, in Deutsch, Springer, neu, Nachdruck.
New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
Spectroscopy of Complex Oxide Interfaces - Photoemission and Related Spectroscopies
ISBN: 9783319749891 bzw. 3319749897, vermutlich in Englisch, neu, E-Book, elektronischer Download.
Spectroscopy of Complex Oxide Interfaces: This book summarizes the most recent and compelling experimental results for complex oxide interfaces. The results of this book were obtained with the cutting-edge photoemission technique at highest energy resolution. Due to their fascinating properties for new-generation electronic devices and the challenge of investigating buried regions, the book chiefly focuses on complex oxide interfaces. Englisch, Ebook.
Spectroscopy of Complex Oxide Interfaces: Photoemission and Related Spectroscopies (Paperback) (2019)
ISBN: 9783030091217 bzw. 303009121X, in Deutsch, Springer, United States, Taschenbuch, neu.
Language: English. Brand new Book. This book summarizes the most recent and compelling experimental results for complex oxide interfaces. The results of this book were obtained with the cutting-edge photoemission technique at highest energy resolution. Due to their fascinating properties for new-generation electronic devices and the challenge of investigating buried regions, the book chiefly focuses on complex oxide interfaces. The crucial feature of exploring buried interfaces is the use of soft X-ray angle-resolved photoemission spectroscopy (ARPES) operating on the energy range of a few hundred eV to increase the photoelectron mean free path, enabling the photons to penetrate through the top layers - in contrast to conventional ultraviolet (UV)-ARPES techniques. The results presented here, achieved by different research groups around the world, are summarized in a clearly structured way and discussed in comparison with other photoemission spectroscopy techniques and other oxide materials. They are complemented and supported by the most recent theoretical calculations as well as results of complementary experimental techniques including electron transport and inelastic resonant X-ray scattering.
Spectroscopy of Complex Oxide Interfaces (2018)
ISBN: 9783319749891 bzw. 3319749897, in Englisch, Springer, Springer, Springer, neu, E-Book, elektronischer Download.
This book summarizes the most recent and compelling experimental results for complex oxide interfaces. The results of this book were obtained with the cutting-edge photoemission technique at highest energy resolution. Due to their fascinating prop.
Spectroscopy of Complex Oxide Interfaces
ISBN: 9783319749891 bzw. 3319749897, vermutlich in Englisch, Springer Shop, neu, E-Book, elektronischer Download.
This book summarizes the most recent and compelling experimental results for complex oxide interfaces. The results of this book were obtained with the cutting-edge photoemission technique at highest energy resolution. Due to their fascinating properties for new-generation electronic devices and the challenge of investigating buried regions, the book chiefly focuses on complex oxide interfaces. The crucial feature of exploring buried interfaces is the use of soft X-ray angle-resolved photoemission spectroscopy (ARPES) operating on the energy range of a few hundred eV to increase the photoelectron mean free path, enabling the photons to penetrate through the top layers – in contrast to conventional ultraviolet (UV)-ARPES techniques. The results presented here, achieved by different research groups around the world, are summarized in a clearly structured way and discussed in comparison with other photoemission spectroscopy techniques and other oxide materials. They are complemented and supported by the most recent theoretical calculations as well as results of complementary experimental techniques including electron transport and inelastic resonant X-ray scattering. eBook.
Spectroscopy of Complex Oxide Interfaces
ISBN: 9783319749884 bzw. 3319749889, vermutlich in Englisch, Springer Shop, gebundenes Buch, neu.
This book summarizes the most recent and compelling experimental results for complex oxide interfaces. The results of this book were obtained with the cutting-edge photoemission technique at highest energy resolution. Due to their fascinating properties for new-generation electronic devices and the challenge of investigating buried regions, the book chiefly focuses on complex oxide interfaces. The crucial feature of exploring buried interfaces is the use of soft X-ray angle-resolved photoemission spectroscopy (ARPES) operating on the energy range of a few hundred eV to increase the photoelectron mean free path, enabling the photons to penetrate through the top layers – in contrast to conventional ultraviolet (UV)-ARPES techniques. The results presented here, achieved by different research groups around the world, are summarized in a clearly structured way and discussed in comparison with other photoemission spectroscopy techniques and other oxide materials. They are complemented and supported by the most recent theoretical calculations as well as results of complementary experimental techniques including electron transport and inelastic resonant X-ray scattering. Hard cover.
Spectroscopy of Complex Oxide Interfaces - Photoemission and Related Spectroscopies
ISBN: 9783319749884 bzw. 3319749889, vermutlich in Deutsch, Springer-Verlag Gmbh, gebundenes Buch, neu.
Spectroscopy of Complex Oxide Interfaces: This book summarizes the most recent and compelling experimental results for complex oxide interfaces. The results of this book were obtained with the cutting-edge photoemission technique at highest energy resolution. Due to their fascinating properties for new-generation electronic devices and the challenge of investigating buried regions, the book chiefly focuses on complex oxide interfaces. The crucial feature of exploring buried interfaces is the use of soft X-ray angle-resolved photoemission spectroscopy (ARPES) operating on the energy range of a few hundred eV to increase the photoelectron mean free path, enabling the photons to penetrate through the top layers - in contrast to conventional ultraviolet (UV)-ARPES techniques. The results presented here, achieved by different research groups around the world, are summarized in a clearly structured way and discussed in comparison with other photoemission spectroscopy techniques and other oxide materials. They are complemented and supported by the most recent theoretical calculations as well as results of complementary experimental techniques including electron transport and inelastic resonant X-ray scattering. Englisch, Buch.
/ Strocov | Spectroscopy of Complex Oxide Interfaces | Springer GmbH | 2018
ISBN: 9783319749884 bzw. 3319749889, vermutlich in Deutsch, Springer-Verlag GmbH, neu.
Spectroscopy of Complex Oxide Interfaces
ISBN: 9783319749884 bzw. 3319749889, vermutlich in Deutsch, neu.
This book summarizes the most recent and compelling experimental results for complex oxide interfaces. The results of this book were obtained with the cutting-edge photoemission technique at highest energy resolution. Due to their fascinating properties for new-generation electronic devices and the challenge of investigating buried regions, the book chiefly focuses on complex oxide interfaces. The crucial feature of exploring buried interfaces is the use of soft X-ray angle-resolved photoemission spectroscopy (ARPES) operating on the energy range of a few hundred eV to increase the photoelectron mean free path, enabling the photons to penetrate through the top layers - in contrast to conventional ultraviolet (UV)-ARPES techniques. The results presented here, achieved by different research groups around the world, are summarized in a clearly structured way and discussed in comparison with other photoemission spectroscopy techniques and other oxide materials. They are complemented and supported by the most recent theoretical calculations as well as results of complementary experimental techniques including electron transport and inelastic resonant X-ray scattering.