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100%: Sergei N. Magonov, Myung-Hwan Whangbo: Surface Analysis with STM and AFM (ISBN: 9783527615117) 2007, Wiley-VCH, Erstausgabe, in Englisch.
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60%: Sergei N. Magonov; Myung-Hwan Whangbo: Surface Analysis with STM and AFM (ISBN: 9783527615100) 2008, in Englisch, Taschenbuch.Nur diese Ausgabe anzeigen…
Surface Analysis with STM and AFM - 9 Angebote vergleichen
Bester Preis: € 151,61 (vom 15.07.2013)1
Surface Analysis with STM and AFM (2008)
~EN NW EBISBN: 9783527615100 bzw. 3527615105, vermutlich in Englisch, Wiley-VCH, neu, E-Book.
Lieferung aus: Schweiz, Sofort per Download lieferbar.
Experimental and Theoretical Aspects of Image Analysis, Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for surface examination. In the past, many STM and AFM studies led to erroneous conclusions due to lack of proper theoretical considerations and of an understanding of how image patterns are affected by measurement conditions. For this book, two world experts, one on theoretical analysis and the other on experimental characterization, have joined forces to bring together essential components of STM and AFM studies: The practical aspects of STM, the image simulation by surface electron density plot calculations, and the qualitative evaluation of tip-force induced surface corrugations. Practical examples are taken from: * inorganic layered materials * organic conductors * organic adsorbates at liquid-solid interfaces * self-assembled amphiphiles * polymers This book will be an invaluable reference work for researchers active in STM and AMF as well as for newcomers to the field. PDF, 26.09.2008.
Experimental and Theoretical Aspects of Image Analysis, Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for surface examination. In the past, many STM and AFM studies led to erroneous conclusions due to lack of proper theoretical considerations and of an understanding of how image patterns are affected by measurement conditions. For this book, two world experts, one on theoretical analysis and the other on experimental characterization, have joined forces to bring together essential components of STM and AFM studies: The practical aspects of STM, the image simulation by surface electron density plot calculations, and the qualitative evaluation of tip-force induced surface corrugations. Practical examples are taken from: * inorganic layered materials * organic conductors * organic adsorbates at liquid-solid interfaces * self-assembled amphiphiles * polymers This book will be an invaluable reference work for researchers active in STM and AMF as well as for newcomers to the field. PDF, 26.09.2008.
2
Surface Analysis with STM and AFM (2008)
~EN NW EBISBN: 9783527615100 bzw. 3527615105, vermutlich in Englisch, Wiley-VCH, neu, E-Book.
Lieferung aus: Deutschland, Sofort per Download lieferbar.
Experimental and Theoretical Aspects of Image Analysis Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for surface examination. In the past, many STM and AFM studies led to erroneous conclusions due to lack of proper theoretical considerations and of an understanding of how image patterns are affected by measurement conditions. For this book, two world experts, one on theoretical analysis and the other on experimental characterization, have joined forces to bring together essential components of STM and AFM studies: The practical aspects of STM, the image simulation by surface electron density plot calculations, and the qualitative evaluation of tip-force induced surface corrugations. Practical examples are taken from: * inorganic layered materials * organic conductors * organic adsorbates at liquid-solid interfaces * self-assembled amphiphiles * polymers This book will be an invaluable reference work for researchers active in STM and AMF as well as for newcomers to the field. 26.09.2008, PDF.
Experimental and Theoretical Aspects of Image Analysis Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for surface examination. In the past, many STM and AFM studies led to erroneous conclusions due to lack of proper theoretical considerations and of an understanding of how image patterns are affected by measurement conditions. For this book, two world experts, one on theoretical analysis and the other on experimental characterization, have joined forces to bring together essential components of STM and AFM studies: The practical aspects of STM, the image simulation by surface electron density plot calculations, and the qualitative evaluation of tip-force induced surface corrugations. Practical examples are taken from: * inorganic layered materials * organic conductors * organic adsorbates at liquid-solid interfaces * self-assembled amphiphiles * polymers This book will be an invaluable reference work for researchers active in STM and AMF as well as for newcomers to the field. 26.09.2008, PDF.
3
Surface Analysis with STM and AFM (2007)
EN NW FEISBN: 9783527615117 bzw. 3527615113, in Englisch, 335 Seiten, Wiley-VCH, neu, Erstausgabe.
Lieferung aus: Vereinigte Staaten von Amerika, Usually ships in 10 to 12 days.
Von Händler/Antiquariat, Amazon.com.
Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for surface examination. In the past, many STM and AFM studies led to erroneous conclusions due to lack of proper theoretical considerations and of an understanding of how image patterns are affected by measurement conditions. For this book, two world experts, one on theoretical analysis and the other on experimental characterization, have joined forces to bring together essential components of STM and AFM studies: The practical aspects of STM, the image simulation by surface electron density plot calculations, and the qualitative evaluation of tip-force induced surface corrugations. Practical examples are taken from: * inorganic layered materials * organic conductors * organic adsorbates at liquid-solid interfaces * self-assembled amphiphiles * polymers This book will be an invaluable reference work for researchers active in STM and AMF as well as for newcomers to the field. Printed Access Code, Ausgabe: 1, Label: Wiley-VCH, Wiley-VCH, Produktgruppe: Book, Publiziert: 2007-12-24, Studio: Wiley-VCH.
Von Händler/Antiquariat, Amazon.com.
Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for surface examination. In the past, many STM and AFM studies led to erroneous conclusions due to lack of proper theoretical considerations and of an understanding of how image patterns are affected by measurement conditions. For this book, two world experts, one on theoretical analysis and the other on experimental characterization, have joined forces to bring together essential components of STM and AFM studies: The practical aspects of STM, the image simulation by surface electron density plot calculations, and the qualitative evaluation of tip-force induced surface corrugations. Practical examples are taken from: * inorganic layered materials * organic conductors * organic adsorbates at liquid-solid interfaces * self-assembled amphiphiles * polymers This book will be an invaluable reference work for researchers active in STM and AMF as well as for newcomers to the field. Printed Access Code, Ausgabe: 1, Label: Wiley-VCH, Wiley-VCH, Produktgruppe: Book, Publiziert: 2007-12-24, Studio: Wiley-VCH.
4
Surface Analysis with STM and AFM
DE NWISBN: 9783527615100 bzw. 3527615105, in Deutsch, Wiley-VCH, Weinheim, Deutschland, neu.
Lieferung aus: Vereinigtes Königreich Großbritannien und Nordirland, Versandkostenfrei.
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Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
6
Surface Analysis with STM and AFM
~EN PB NW EB DLISBN: 9783527615100 bzw. 3527615105, vermutlich in Englisch, Wiley-VCH, Taschenbuch, neu, E-Book, elektronischer Download.
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7
Surface Analysis with STM and AFM (2008)
DE NW EBISBN: 9783527615100 bzw. 3527615105, in Deutsch, Wiley-Vch Verlag GmbH, neu, E-Book.
Lieferung aus: Schweiz, Sofort per Download lieferbar.
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
8
Surface Analysis with STM and AFM (2008)
DE NW EBISBN: 9783527615100 bzw. 3527615105, in Deutsch, Wiley-Vch Verlag GmbH, neu, E-Book.
Lieferung aus: Deutschland, Sofort per Download lieferbar.
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
9
Surface Analysis with STM and AFM - Experimental and Theoretical Aspects of Image Analysis
DE NW EB DLISBN: 9783527615100 bzw. 3527615105, in Deutsch, Wiley-VCH, neu, E-Book, elektronischer Download.
Lieferung aus: Deutschland, Versandkostenfrei.
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
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